Iec 612982 New Free Access
(ED3) is currently in development and expected to reach final approval in late 2025 The "New" IEC 61298-2 Update The latest draft version, prEN IEC 61298-2:2024
prEN IEC 61298-2:2024 - Process Control Devices Performance Tests
: Document the deviations at each interval to map exact error behavior across multiple measurement cycles. Industrial Impact for Stakeholders Stakeholder Group Direct Action Required Impact of New Edition Device Manufacturers
IEC 61298 series is a foundational set of international standards for evaluating the performance of process measurement and control devices. While the current active version of Part 2 (IEC 61298-2) dates back to 2008, new third edition iec 612982 new
During test, the device's digital output (if present) must be monitored for:
Older versions assumed pure analog 4–20 mA loops. The new standard introduces "supply ripple" tests (up to 200 mV peak-to-peak at 100 kHz) to mimic modern switch-mode power supplies.
To guarantee identical baseline results across global test laboratories, IEC 61298-2 dictates precise environmental thresholds during the evaluation window. These parameters typically dictate: (ED3) is currently in development and expected to
The latest information regarding indicates that a new version, Edition 3.0 , is currently in the final stages of publication and is scheduled for release in 2026 . Status of IEC 61298-2:2026
The IEC 61298 series serves as the baseline for evaluating process instrumentation. While Part 1 outlines general considerations, . This isolation ensures that external variables—such as temperature swings, power spikes, or vibration—do not corrupt the evaluation of a device’s baseline capabilities.
The deviation from a specified straight-line relationship. The new standard introduces "supply ripple" tests (up
: The new version aligns with modern technologies and standards, such as Industry 4.0 and the Internet of Things (IoT). It incorporates requirements for data exchange in digital transformation initiatives.
Deviation from a straight calibration line drawn exactly through the zero and full-scale end points. Normalized curve graphics.
